{"product_id":"transmission-electron-microscope","title":"Transmission Electron Microscope","description":"\u003cp\u003eProduct Name Transmission Electron Microscope Product Overview English Introduction: Transmission Electron Microscope (TEM) is one of the high-resolution micro-characterization equipment in the material field. It uses high-energy electron beams to penetrate ultra-thin samples and forms images through electronic signals, realizing micro observation of materials at micron, nanometer and even atomic levels. Different from ordinary optical microscopes, TEM can directly display microscopic information such as internal morphology, lattice structure, grain size, defects and interface structure of materials. Combined with supporting testing methods including EDS energy spectrum, SAED electron diffraction and Mapping surface scanning, it can complete integrated detection of material morphology observation, qualitative and quantitative component analysis, crystal structure analysis and element distribution characterization. This service is equipped with two high-end field emission transmission electron microscopes, American FEI Talos F200X G2 and Japanese JEOL 2100F, covering full-range TEM testing items such as conventional morphology, high resolution, element point\/surface scanning and electron diffraction. It is suitable for various sample types including powder, liquid dispersed samples and thin film materials. Widely applied in cutting-edge scientific research and industrial quality inspection fields such as new energy, nanomaterials, semiconductors, polymers, geology, mineral resources and biomedicine, it features high detection resolution, clear imaging and authoritative data, meeting professional needs for paper publication, scientific research conclusion, product performance demonstration and project application. Technical Parameter English Parameters: Accelerating voltage: Standard 200kV, the electron beam wavelength is as low as 2.5pm, with ultra-high penetration capacity, suitable for the detection of thick and dense samples Point resolution: Up to 0.25nm, lattice resolution up to 0.14nm, which can clearly observe atomic arrangement, lattice fringes and micro defects Imaging system: Ultra-high resolution objective lens system with million-level magnification, clear and distortion-free imaging with high detail restoration Energy spectrum configuration: Equipped with high-precision EDS energy spectrometer, supporting multi-mode element analysis of point scan, line scan and surface scan with wide element detection range and high accuracy Diffraction function: Standard SAED selected area electron diffraction function, which can accurately analyze crystal form, lattice constant, preferred orientation and defect structure Applicable samples: Support testing of various micro-nano materials such as nanopowders, liquid dispersed samples, thin films and two-dimensional materials Instrument stability: Dual-equipment closed-loop vacuum system with strong anti-interference ability, no drift during long-term imaging and excellent data repeatability Product Features Dual imported flagship instruments with full project coverage: Equipped with two top international brand transmission electron microscopes, American FEI and Japanese JEOL, which are adapted to different testing scenarios such as conventional morphology, high resolution, element analysis and electron diffraction respectively. It covers all TEM testing requirements and completes full-set micro-characterization in one stop without cross-institution detection. Atomic-level ultra-high resolution with top imaging quality: The instrument can achieve sub-nanometer and atomic-level observation accuracy, clearly presenting subtle micro-features such as lattice fringes, dislocations, vacancies and interface structures with distortion-free and noise-free imaging, meeting the requirements of top journal papers and high-precision scientific research experiments. Multi-dimensional integrated detection with comprehensive data: It can simultaneously realize morphology observation, high-resolution structure analysis, element point\/surface scan distribution analysis and electron diffraction crystal analysis. A single test can obtain multi-dimensional data of morphology, structure, composition and distribution, greatly improving scientific research efficiency. Special adaptation for special samples with strong compatibility: Provide special testing schemes for easily interfered special materials such as magnetic samples and quantum dot samples, avoiding signal interference through equipment parameter optimization, ensuring the detection accuracy of special samples and filling the blind area of conventional tests. Trace sample requirement adapted to rare materials: Only 3mg powder or 2mL liquid sample is required to complete the full set of tests with extremely low sample dosage and no massive loss, adapting to the detection needs of rare, trace and expensive new nanomaterials. Standardized service with high customization: Unified 5-7 working days detection cycle, with 6-8 high-definition original images output conventionally; support designated instrument models, customized scanning areas and magnification to adapt to refined testing needs of different scientific research. Highly recognized authoritative data: The instrument parameters are aligned with international scientific research standards, and the imaging quality and analysis data can be used in high-end official scenarios such as SCI paper publication, national-level scientific research project conclusion, new material product quality inspection and patent application. Application Fields Nano Material Field: Observation of morphology and size, analysis of lattice structure and defects, and characterization of element distribution of nanoparticles, nanowires, nanosheets, quantum dots and two-dimensional materials, serving as a core method for basic R\u0026amp;D of nanomaterials. New Energy Material Field: Analysis of micro structure, phase transition mechanism, interface defects and element migration of lithium battery and sodium battery anode and cathode materials, electrolyte-derived films, photovoltaic materials and energy storage materials, supporting battery performance optimization and life iteration. Semiconductor and Electronic Material Field: Detection of crystal structure, interface bonding, micro defects and doping element distribution of chip substrates, thin-film semiconductors, nano-devices and conductive materials to ensure the accuracy and stability of electronic devices. Polymer and Composite Material Field: Analysis of filler dispersibility, interface structure and micro morphology of polymer nanocomposites, modified fillers and fiber reinforced materials, assisting material modification and performance improvement. Catalytic Material Field: Characterization of grain size, lattice defects, active element distribution and micro structure of metal catalysts, nano-catalytic powders and porous catalytic materials, supporting catalytic mechanism research and catalyst optimization. Biomedical Field: Micro morphology and structural analysis of biological nanocarriers, drug microspheres, biomacromolecules and ultra-fine cell structures, adapting to cutting-edge biomedical scientific research. Geology and Powder Industry Field: Detection of crystal morphology, structural defects and component distribution of ultra-fine mineral powders, rock microstructures and industrial ultra-fine powders, meeting the needs of industrial quality inspection and geological research.\u003c\/p\u003e","brand":"xfnano","offers":[{"title":"1 sample Morphology, generally 6-8 images, magnetic +100 111264 \/ Store at room temperature \/ 365days","offer_id":57280580157818,"sku":"111264","price":78.13,"currency_code":"USD","in_stock":true},{"title":"1 sample High resolution, magnetic\/quantum dot +100 111265 \/ Store at room temperature \/ 365days","offer_id":57280580190586,"sku":"111265","price":93.75,"currency_code":"USD","in_stock":true},{"title":"1 sample Mapping (surface scan) 111266 \/ Store at room temperature \/ 365days","offer_id":57280580223354,"sku":"111266","price":117.19,"currency_code":"USD","in_stock":true},{"title":"1 sample EDS (point scan) 111267 \/ Store at room temperature \/ 365days","offer_id":57280580256122,"sku":"111267","price":31.25,"currency_code":"USD","in_stock":true},{"title":"1 sample Electron diffraction (SAED) 111268 \/ Store at room temperature \/ 365days","offer_id":57280580288890,"sku":"111268","price":15.63,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0907\/3606\/6938\/files\/1_27871cef-ce01-415a-9a0e-d29d5e516d17.png?v=1780024497","url":"https:\/\/chinanano.com\/fr\/products\/transmission-electron-microscope","provider":"xfnano","version":"1.0","type":"link"}