X-Ray Diffraction Test (XRD)

Product Name X-Ray Diffraction Test (XRD) Product Overview English Introduction: X-ray Diffraction (XRD) is a non-destructive detection technology based on the interaction between X-rays and crystalline substances, and it is a core method for material microstructural characterization. By irradiating samples with X-rays and collecting diffraction signals, this technology can accurately analyze key micro parameters of materials, including crystal structure, phase composition, crystallinity, grain size, lattice defects and stress distribution. Equipped with two high-end industrial testing instruments, namely Bruker D8 wide-angle diffractometer (Germany) and Rigaku SmartLab intelligent X-ray polycrystalline diffractometer (Japan), it covers full-dimensional wide-angle and small-angle diffraction detection scenarios, suitable for various sample types such as powders and solids. It is widely used in materials research, chemical industry, geology, new energy, semiconductor and other fields with accurate detection data and high repeatability, meeting various testing requirements for scientific research experiments, product quality inspection and project application. Technical Parameter English Parameters: X-ray light source: Cu target Kα ray, wavelength 1.5406Å, stability ≤0.005% Goniometer structure: θ-θ horizontal diffraction structure, precise diffraction circle radius, angle repeatability ≤±0.001° Detector: High-precision scintillation detector, maximum count rate ≥1×10⁶ imp/sec, high detection sensitivity Operating power: Standard 40kV/15mA, stable whole machine operation, suitable for long-term continuous detection Detection mode: Supports continuous scanning and step scanning, with customizable scanning parameters according to testing requirements Product Features Full coverage with dual instruments and wide scenario adaptation: Equipped with two imported high-end diffractometers from Bruker (Germany) and Rigaku (Japan), corresponding to exclusive wide-angle and small-angle detection scenarios respectively. It covers the detection needs of all types of materials such as conventional materials, microporous/mesoporous materials, thin films and polymers, making up for the limitations of single equipment detection. High detection accuracy and authoritative data: The angle resolution and repeatability of the equipment are at the top level in the industry, strictly complying with national and international testing standards. The detection data can be used in official scenarios such as academic paper publication, scientific research achievement acceptance, product quality inspection reports and bidding applications. Non-destructive and recyclable with high sample utilization: Adopts non-destructive detection method, only 100mg powder sample is required, and the sample can be completely recycled after detection, which greatly reduces the customer's sample loss cost and adapts to the detection needs of rare and trace samples. Stable timeliness and efficient service: Standardized detection process with a fixed 3-5 working days detection cycle without extra delay. The whole progress is traceable, and complete detection spectra and analysis reports can be issued quickly. Flexible parameters and strong customization: Supports customized scanning speed, step length and angle range. High-precision and high-resolution detection schemes can be customized according to customers' scientific research and testing needs, adapting to refined scientific research experiments. Application Fields New Energy Materials: Phase analysis, crystallinity detection and structural stability characterization of lithium battery positive and negative electrode materials, electrolyte materials, photovoltaic materials and energy storage materials, supporting battery performance optimization and R&D iteration. Inorganic Non-metallic Materials: Crystal structure analysis, impurity phase detection and raw material purity verification of ceramics, glass, cement, ores, graphene, carbon materials and other samples. Polymer and Composite Materials: Detection of crystallization behavior, orientation structure and micro defects of plastics, rubber, fibers, organic films and other materials, adapting to polymer material modification research. Chemical and Pharmaceutical Materials: Phase identification and grain size analysis of chemical powder, catalysts, pharmaceutical crystals and nanomaterials, supporting pharmaceutical crystal form R&D and chemical catalysis optimization. Geology and Mineral Resources: Composition analysis, phase identification and geological structure research of rock, mineral and soil samples, meeting the needs of geological exploration and mineral quality inspection. Semiconductor and Electronic Materials: Detection of micro structure and stress distribution of wafers, thin films and chip substrates to ensure the production accuracy and stability of electronic materials.